FIT's The Future Of Fashion Runway Show

NEW YORK, NY - MAY 01: Critic Award Winner, Designer Gayong Ahn (R) attends FIT's The Future Of Fashion Runway Show at The Fashion Institute of Technology on May 1, 2014 in New York City. (Photo by Mike Pont/Getty Images)
NEW YORK, NY - MAY 01: Critic Award Winner, Designer Gayong Ahn (R) attends FIT's The Future Of Fashion Runway Show at The Fashion Institute of Technology on May 1, 2014 in New York City. (Photo by Mike Pont/Getty Images)
FIT's The Future Of Fashion Runway Show
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Credit:
Mike Pont / Contributor
Editorial #:
487755043
Collection:
Getty Images Entertainment
Date created:
May 01, 2014
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Source:
Getty Images North America
Object name:
79704390