FIT's The Future Of Fashion Runway Show
NEW YORK, NY - MAY 01: Critic Award Winner, Designer Gayong Ahn (R) attends FIT's The Future Of Fashion Runway Show at The Fashion Institute of Technology on May 1, 2014 in New York City. (Photo by Mike Pont/Getty Images)
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Editorial #:
487755043
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Getty Images Entertainment
Date created:
May 01, 2014
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Getty Images North America
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79704390